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Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupatio
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Shipping options
Offer policy
OBO - Seller accepts offers on this item.
Details
Return policy
Purchase protection
Payment options
PayPal accepted
PayPal Credit accepted
Venmo accepted
PayPal, MasterCard, Visa, Discover, and American Express accepted
Maestro accepted
Amazon Pay accepted
Nuvei accepted
Item traits
| Category: | |
|---|---|
| Quantity Available: |
Only one in stock, order soon |
| Condition: |
Like New |
| ISBN: |
1107124360 |
| Format: |
Hardcover |
| Type: |
Textbook |
| Language: |
English |
| Publication Year: |
2017 |
| Book Title: |
Next Generation Technology-Enhanced Assessment: Global Perspectiv |
| Number of Pages: |
440 Pages |
| Publication Name: | |
| Publisher: |
Cambridge University Press |
| Subject: |
Training/Applied Psychology |
| Item Height: |
1 in |
| Item Weight: |
25.5 Oz |
| Author: |
Dave Bartram |
| Item Length: |
9.3 in |
| Subject Area: |
Psychology/Business & Economics |
| Item Width: |
6.2 in |
| Series: |
Educational and Psychological Testing in a Global Context Ser. |
Listing details
| Shipping discount: |
Shipping weights of all items added together for savings. |
|---|---|
| Posted for sale: |
More than a week ago |
| Item number: |
1718984612 |
Item description
The product is a textbook titled "Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing" by author Dave Bartram. It was published by Cambridge University Press in 2017 as part of the Educational and Psychological Testing in a Global Context series. The book, with 440 pages, explores the intersection of training and applied psychology in the context of modern technology-enhanced assessment methods, providing insights on occupational and workplace testing from a global perspective.
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- Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupatio
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